CVE-2024-53023
Published: 03 March 2025
Description
Memory corruption may occur while accessing a variable during extended back to back tests.
Security Summary
CVE-2024-53023 is a memory corruption vulnerability stemming from a use-after-free error (CWE-416) that can occur while accessing a variable during extended back-to-back tests. It carries a CVSS v3.1 base score of 7.8 (AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H) and affects components in Qualcomm products, as documented in their security advisories.
A local attacker with low privileges can exploit this vulnerability with low attack complexity and no user interaction required. Successful exploitation enables high-impact disruption to confidentiality, integrity, and availability through memory corruption, potentially allowing arbitrary code execution or system compromise within the affected scope.
Qualcomm's March 2025 security bulletin provides details on the vulnerability, including affected products and recommended patches or mitigations, available at https://docs.qualcomm.com/product/publicresources/securitybulletin/march-2025-bulletin.html.
Details
- CWE(s)